Topological Techniques for Characterization of Nanodot Patterns
When a nominally flat binary compound is bombarded with a broad ion beam, disordered hexagonal arrays of nanodots can form. This process can be described by the Bradley-Shipman equations. Model parameters are reflected directly in dynamic data in a way that is made accessible by studying the topological structure of the pattern. We will give a brief introduction to a topological technique, namely persistent homology, that provides a valuable lens through which to characterize the order of these nanodot arrays and to investigate the influence of nonlinear parameters on pattern formation and defects evolution.